Information and communication technologies

Facilities

• Atomic Force Microscopy
• Atomic Layer Deposition
• Bruker D8 Discover High-Resolution X-Ray Diffraction System
• Canadian Photonics Fabrication Centre
• Chemically Assisted Ion Beam Etching (CAIBE)
• Contact aligners (Optical Lithography)
• Direct-write Electron Beam Lithography Facility
• Direct-write optical lithography system
• Ellipsometer
• Hitachi S-4700 Field-Emission Scanning Electron Microscope
• Inductively Coupled Plasma Reactive Ion Etching (ICP RIE)
• Industry Partnership Facility (IPF) Fredericton
• Industry Partnership Facility Ottawa
• JEOL-JEM-2100F Field Emission Transmission Electron Microscope
• Laboratory: e-Citizen Studio Lab
• Laboratory: Mobile Human-Computer Interaction (HCI) Lab
• Laboratory: Voice-Multimodal Lab (VML)
• Metal Evaporation
• PANalytical MRD High-Resolution X-Ray Diffractometer
• Plasma-Enhanced Chemical Vapor Deposition (PECVD)
• Raman Scattering Spectroscopy
• Rapid Thermal Annealing
• Riber 32P III-V Chemical Beam Epitaxy system (IMS)
• Scanning Auger Microscope and Spectrometer
• Scanning Electron Microscope (SEM)
• Secondary ion mass Spectrometry (SIMS)
• Semantic Web Lab (SemWebLab)
• Semiconductor Device Design & Test
• Semiconductor Devices Fabrication
• Semiconductor Material Characterization & Analysis
• Semiconductor-related Deposition
• Service-Oriented Systems (S.O.S.) Lab
• Stress analyzer
• SVTA S35N Nitride Molecular Beam Epitaxy system (IMS)
• V80 Arsenides Molecular Beam Epitaxy system (IMS)
• V90 Multi Group V Molecular Beam Epitaxy system (IMS)
• Want To Gain A Competitive Edge
• X-Ray Photoelectron Spectroscopy