Dimensional Metrology

The dimensional metrology laboratories provide comprehensive calibration services for highest accuracy dimensional measurements in Canada traceable to the SI unit of length, the meter. Parameters include length, angle, flatness, roundness, diameter, surface roughness, 3-D form and line spacing of gratings for metrology in support for nanotechnology. Scientists conduct fundamental research independently and in collaboration with industry, universities, government departments and colleagues worldwide. They also develop state-of-the-art instrumentation for custom measurements, as well as publish and distribute documentation on specific issues impacting dimensional measurements and methods of measurement.

• Publications
• Calibration Services
• Facilities

Metrological Atomic Force Microscope (mAFM)

Scanning probe microscopy (SPM), of which atomic force microscopy (AFM) is a popular subset, is increasingly the instrumentation of choice in many areas of measurement and characterization of nanoscale features. [More]

Coordinate Metrology

Due to its accuracy, versatility, automation and productivity, the Coordinate Measuring Machine (CMM) is the “measurement weapon of choice” in material manufacturing—85% of all manufactured goods are inspected by CMMs. [More]

NRC Part and Method Specific Compensation Procedure

Using the NRC state-of-the-art coordinate measurement machine (CMM), metrologists have created a comprehensive measuring program to calibrate a “master part” which is then used to compensate the CMM on shop floor, improving accuracy by an order of magnitude, and at the same time providing direct traceability to the measurements and accreditation that supports the measurement strategy. [More]

NRC Ball Plate Program for Measurement Assurance

This program makes available, at a reasonable fee, a 320 mm X 320 mm ball plate containing 25 ceramic balls. [More]

Related Information

Institutes:

• NRC Institute for National Measurement Standards