Common menu bar links
Related Information
Institutes & Programs
- NRC Canadian Photonics Fabrication Centre
- NRC Centre for Surface Transportation Technology
- NRC Genomics and Health Initiative
- NRC Imaging Network Portal
- NRC Institute for Aerospace Research
- NRC Institute for Biodiagnostics
- NRC Institute for Information Technology
- NRC Institute for Microstructural Sciences
- NRC Institute for Research in Construction
- National Institute for Nanotechnology
- National Research Council Canada
Key Sectors
Areas of Research
Communities
Careers
Events
Contact
Jean-Marc Baribeau
Phone: 613-993-8249
Fax: 613-941-4667
Email: Jean-Marc.Baribeau@nrc-cnrc.gc.ca
Bruker D8 Discover High-Resolution X-Ray Diffraction System
Bruker AXS D8 Discover is a highly versatile high resolution x-ray diffractometer. It incorporates technological innovations such as a parabolic x-ray mirror and position sensitive detection that enables rapid and accurate characterization of advanced semiconductors, thin films and nanostructured materials. The system is equipped with a video/laser alignment system for accurate site specific diffraction work. The imaging capabilities include reciprocal space mapping of crystalline materials and two-dimensional mapping of structural properties of semiconductor wafers.
Determination of thickness, lattice constant, crystallographic orientation and quality of thin films, and epitaxial layers. High resolution (5, 12 or 30 arc-sec) coplanar diffraction in symmetric, asymmetric or skewed geometry to determine the lattice constant and strain of epitaxial thin films, grazing incidence x-ray reflectometry for the determination of surface roughness and thin film density and thickness. Grazing incidence diffraction for evaluation of crystallography of very thin (< 10 nm) films. Grazing incidence diffraction for evaluation of polycrystalline thin films. Temperature dependent (up to 900oC) diffraction under inert or reactive environment is possible.
Structural characterization of epitaxial thin films and layered media. Crystallographic study and phase identification on very thin films (< 10 nm). Grazing incidence x-ray diffraction . Diffraction at high temperature (up to 900oC).
